Pre-irradiation memory effect on the photoluminexcence intensity of Ge-implanted SiO2 layers

Pre-irradiation memory effect on the photoluminexcence intensity of Ge-implanted SiO2 layers

Lopes, J. M. J.; Zawislak, F. C.; Fichtner, P. F. P.; Behar, M.; Rebohle, L.; Skorupa, W.

• Nuclear Instruments and Methods in Physics Research B 218(2004), 438-443

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