Structural analysis of ion irradiated polycrystalline NiFe/FeMn exchange bias systems


Structural analysis of ion irradiated polycrystalline NiFe/FeMn exchange bias systems

Blomeier, S.; Mcgrouther, D.; Mcvitie, S.; Chapman, J. N.; Weber, M. C.; Hillebrands, B.; Fassbender, J.

Structural investigations of the ion irradiated polycrystalline NiFe/FeMn exchange bias bilayer system were carried out by means of transmission electron microscopy. Key structural parameters like average grain size, lattice constant, and texture, as well as their dependence upon ion irradiation could be determined. For this purpose, a detailed analysis of a series of bright field images, dark field images, and diffraction patterns was performed. Also in this context, a previously established model was tested which ascribes changes in the magnetic properties upon irradiation with 5 keV He+ to the creation of point defects within the antiferromagnetic layer and to the intermixing between the ferromagnetic and antiferromagnetic layers. The obtained results indirectly support this model by excluding the aforementioned structural parameters as a possible source of the observed changes of the magnetic properties.

Keywords: magnetism; exchange-bias; ion irradiation; ion implantation; focused ion beam; TEM

  • European Physical Journal B 45(2005), 213

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