Evidence of a low quartz structure at the SiO2/Si interface from coincidence Doppler broadening spectroscopy

Brauer, Gerhard; Becvar, Frantisek; Anwand, Wolfgang; Skorupa, Wolfgang

Evidence of a low quartz structure at the SiO2/Si interface from coincidence Doppler broadening spectroscopy

Brauer, G.; Becvar, F.; Anwand, W.; Skorupa, W.

Results from coincidence Doppler broadening measurements on various Si samples and Brazilian quartz having low quartz structure are presented with the aim to give further strong evidence for the existence of a low quartz structure, but not Si divacancies, at the SiO2/Si interface.

Keywords: slow-positron spectroscopy; coincidence Doppler broadening; silicon; Brazilian quartz; silicon divacancy; SiO2/Si interface

Lecture (Conference)
10th International conference on slow positron beam techniques for solids and surfaces, 19.-25.03.2005, Doha, Qatar
Applied Surface Science (2007)

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