Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

Brauer, G.; Anwand, W.; Eichhorn, F.; Skorupa, W.; Hofer, C.; Teichert, C.; Kuriplach, J.; Cizek, J.; Prochazka, I.; Coleman, P. G.; Nozawa, T.; Kohyama, A.

A SiC/SiC composite is characterized by X-ray diffraction, atomic force microscopy, and various positron spectroscopies (slow positron implantation, positron lifetime, re-emission). It is found that beside its main constituent 3C-SiC the composite still must contain some graphite. In order to better interpret the experimental findings of the composite, a pyrolytic graphite sample was also investigated by slow positron implantation and positron lifetime spectroscopies. In addition, theoretical calculations of positron properties of graphite are presented.

Keywords: SiC/SiC composite; graphite; X-ray diffraction; atomic force microscopy; slow-positron spectroscopy; positron lifetime; positron affinity; positron re-emission

  • Invited lecture (Conferences)
    10th International conference on slow positron beam techniques for solids and surfaces, 19.-25.03.2005, Doha, Qatar
  • Applied Surface Science 252(2006), 3342-3351

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