Spectroscopic ellipsometry study of the role of the annealing time on nickel induced crystallization of a-Si
Spectroscopic ellipsometry study of the role of the annealing time on nickel induced crystallization of a-Si
Pereira, L.; Águas, H.; Beckers, M.; Martins, R. M. S.; Fortunato, E.; Martins, R.
wird nachgereicht
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Lecture (Conference)
21st International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS 21), 04.-09.09.2005, -, Portugal
Permalink: https://www.hzdr.de/publications/Publ-7523