Spectroscopic ellipsometry study of the role of the annealing time on nickel induced crystallization of a-Si


Spectroscopic ellipsometry study of the role of the annealing time on nickel induced crystallization of a-Si

Pereira, L.; Águas, H.; Beckers, M.; Martins, R. M. S.; Fortunato, E.; Martins, R.

wird nachgereicht

  • Lecture (Conference)
    21st International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS 21), 04.-09.09.2005, -, Portugal

Permalink: https://www.hzdr.de/publications/Publ-7523