Measurements of random and channeling stopping powers and charge state distributions in silicon for 0.2 - 1.2 MeV/u heavy ions

Measurements of random and channeling stopping powers and charge state distributions in silicon for 0.2 - 1.2 MeV/u heavy ions

Jiang, W.; Grötzschel, R.; Pilz, W.; Schmidt, B.; Möller, W.

• Physical Review B Volume 59, Number 1, 1 January 1999, pp. 226-234

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