Writing implantation with a high current density focused ion beam
Writing implantation with a high current density focused ion beam
Bischoff, L.; Hesse, E.; Panknin, D.; Skorupa, W.; Teichert, J.
The Rossendorf Focused Ion Beam IMSA-100 was used for writing implantation of cobalt (E = 30 keV Co+ and 60 keV Co++; D = 0.5...5x1017 cm-2) at room temperature to form CoSi2 microstructures on silicon by ion beam synthesis. For that aim two types of Liquid Alloy Ion Sourses (LAIS) were developed. As implanted and annealed (600°C for 60 min and 1000°C for 30 min in N2 atmosphere) silicide structures were analysed by SEM, EDX and electrical measurments.
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Contribution to external collection
Int. Conf. Microcircnit Engineering ME '93, Masstricht, 27.-29.9.1993 -
Microelectronic Engineering 23 (1994) pp. 115-118
DOI: 10.1016/0167-9317(94)90117-1
Cited 17 times in Scopus
Permalink: https://www.hzdr.de/publications/Publ-80