Characterization of magnetron Sputtered Ni-Ti thin films by in-situ x-ray diffraction and complementary ex-situ techniques

Characterization of magnetron Sputtered Ni-Ti thin films by in-situ x-ray diffraction and complementary ex-situ techniques

Martins, R. M. S.; Beckers, M.; Mücklich, A.; Schell, N.; Silva, R. J. C.; Braz Fernandes, F. M.

• Lecture (Conference)
  EUROMAT 2005, 05.-08.09.2005, Prague, Czech Republic

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