Comparing the growth of magnetron sputter deposited Ti-Al-N and Ni-Ti thin layers by in-situ x-ray diffraction
Comparing the growth of magnetron sputter deposited Ti-Al-N and Ni-Ti thin layers by in-situ x-ray diffraction
Martins, R. M. S.; Beckers, M.; Mücklich, A.; Schell, N.; Silva, R. J. C.; Braz Fernandes, F. M.
Kein Abstract vorhanden.
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Lecture (Conference)
EUROMAT 2005, 05.-08.09.2005, Prague, Czech Republic
Permalink: https://www.hzdr.de/publications/Publ-8273
