Electrical characterization of deep acceptor states in nitrogen implanted ZnO single crystals

von Wenckstern, H.; Schmidt, H.; Pickenhain, R.; Biehne, G.; Brandt, M.; Brauer, G.; Lorenz, M.; Grundmann, M.

nicht vorhanden

Lecture (Conference)
E-MRS Spring Meeting 2006, 29.06.-02.07.2006, Nice, France

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