Influence of hydrogen peroxide treatment on Au/n-ZnO contact

The Au/n-ZnO contact behavior was investigated as a function of hydrogen peroxide pre-treatment of the ZnO sample by current-voltage (IV) measurement. The change from non-rectifying to rectifying performance upon etching was discussed in connection with sample characterization by positron annihilation spectroscopy (PAS), Auger electron spectroscopy (AES) and scanning electron microscopy (SEM). It was concluded that the gain of the rectifying property was properly associated with the formation of a defective interfacial region at the Au/n-ZnO contact.