Ion-beam modification of ISFET membranes for copper ion detection

Ion-beam modification of ISFET membranes for copper ion detection

Hüller, J.; Pham, T.; Vopel, T.; Albrecht, J.

• Sensors and Actuators B 24-25 (1995) pp.225-227
  DOI: 10.1016/0925-4005(95)85048-1
  Cited 6 times in Scopus

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