Single Shot Intrared Ellipsometry with a Free Electron Laser and its Potential Applications
Single Shot Intrared Ellipsometry with a Free Electron Laser and its Potential Applications
Gensch, M.; Lee, J. S.; Hinrichs, K.; Esser, N.; Seidel, W.; Röseler, A.; Schade, U.
A novel division of amplitude polarimeter (DOAP) approach for single shot - infrared ellipsometry with a free electron laser source is presented. The set-up enables the simultaneous determination of the two independent ellipsometric parameters by measuring two ratios of intensities so that variations of the pulse power essentially do not affect the result. As proof-of-principle experiment we determined successfully the optical response of thin polymeric films on silicon. The high brilliance of the ELBE free electron laser combined with the DOAP principle gives unique opportunities for e.g. micro-focus, imaging or pump-probe ellipsometry.
-
Poster
Joint 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics, 18.-22.09.2006, Shanghai, China -
Contribution to proceedings
Joint 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics, 18.-22.09.2006, Shanghai, China
Conference digest of the 2006 IRMMW-THz 2006, 1-4244-0400-2, 416
Permalink: https://www.hzdr.de/publications/Publ-9233