Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis

ZnO nanorods, grown by a hydrothermal method, have been characterized by slow positron implantation spectroscopy (SPIS) and atomic force microscopy (AFM). It has been demonstrated that such non-destructive characterization techniques can provide a comprehensive picture of the nanorod structure (including its length, shape, orientation, and seed layer thickness), as well as provide additional information about defects present in the structure. Nanorods were also characterized by scanning electron microscopy (SEM) and X-ray diffraction (XRD), and it was found that the combination SPIS/AFM is more sensitive to the nanorod orientation and the thickness of the seed layer. To obtain still more information about defects in the nanorods, as well as to confirm the findings on the sample structure, nuclear reaction analysis (NRA) was performed and a large concentration of bound hydrogen was found. The results obtained by different characterization techniques are discussed.