The (224) asymmetrical reflection from laterally patterned heteroepitaxial inGaAs/GaAs layers

The (224) asymmetrical reflection from laterally patterned heteroepitaxial inGaAs/GaAs layers

Mazur, K.; Sass, J.; Eichhorn, F.; Strupinski, W.; Turos, A.; Kowalik, A.

• Lecture (Conference)
  Int. Conf. on Experimental and Computing Methods in High Resolution Diffraction Applied for Structure Characterization of Modern Materials, 13.-17.06.2004, Zakopane, Poland

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