Optical characterization of beta-FeSi2 layers formed by ion beam synthesis
Optical characterization of beta-FeSi2 layers formed by ion beam synthesis
Ayache, R.; Bouabellou, A.; Richter, E.
There is no abstract provided.
-
Poster
E-MRS Spring Meeting, 24.-28.05.2004, Strasbourg, France
Permalink: https://www.hzdr.de/publications/Publ-9817