Depth profiling of defects using a slow positron beam

Depth profiling of defects using a slow positron beam

Brauer, G.

The fundamentals of and recent results on depth profiling of defects in materials by means of a slow positron beam are reported.

Keywords: depth profiling; defects; positron beam; PAS

  • Lecture (Conference)
    35th Polish Seminar on Positron Annihilation, 20.-24.09.2004, Turawa, Polska

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