Nanocluster-rich silicon dioxide layers: electroluminescence and charge trapping

Nanocluster-rich silicon dioxide layers: electroluminescence and charge trapping

Gebel, T.; Rebohle, L.; Yankov, R. A.; Nazarov, A. N.; Skorupa, W.

Keywords: Nanocluster; silicon dioxide layers; electroluminescence; charge trapping

• Contribution to external collection
  Pistora, Jaromir (u.a.): Microwave and Optical Technology 2003, Proceedings of the SPIE, Volume 5445, Bellingham, WA, USA: SPIE Int. Soc. Opt. Eng., 2004, 284-289

Permalink: https://www.hzdr.de/publications/Publ-9934