Pattering data from NPVE software for Helium Ion Microscopy (HIM) irradiation data


Pattering data from NPVE software for Helium Ion Microscopy (HIM) irradiation data

Hlawacek, G.; Fowley, C.; Kuria, J.
Project Member: Fowley, Ciaran; Project Member: Kurian, Jinu; Project Leader: Doudin, Bernard

Pattering data from NPVE software for Helium Ion Microscopy (HIM) irradiation data

Keywords: focused ion beam; helium ion microscopy; nanopatterning; magnetic

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