Contact

Dr. Stefan Facsko

Head of Ion Beam Center
s.facskoAthzdr.de
Phone: +49 351 260 2987

Ion Beam Analysis and Structural Analysis

The project groups Ion Beam Analysis and Structural Analysis are concerned with the analysis of the chemical, physical, and morphological properties of (ion-modified) solid surfaces and thin films. The analytical methods make use of the interaction of high-energy ions, electrons, and X-ray beams with solid surfaces.


Topics

  • Element and structure analysis of thin films and at surfaces
  • Micro-/Nanoscale analysis
  • In situ analysis during film deposition/thermal processes
  • Phase formation and transformations/lattice properties
  • Characterization of interfacial and surface morphology
  • Non-destructive analysis of art and cultural objects
  • Resource analysis (in cooperation with the Helmholtz Institute for Resource Technology - HIF)

Available analysis technologies

Browne-Buechner-Spektometer_ausschnitt Ion Beam Analysis
  • Rutherford backscattering spectrometry (RBS)
  • Nuclear recoil spectrometry (ERDA)
  • Nuclear resonance reaction analysis (NRA)
  • Proton-induced X-ray and gamma-ray spectroscopy (PIXE / PIGE)
  • Accelerator mass spectrometry (AMS) - in cooperation with HIF
TEM FWIS Structure Diagnostics
  • Analytical transmission and scanning electron microscopy (TEM / SEM)
  • Analysis with dual-beam systems (ion / electron)
  • Auger electron spectroscopy (AES)
  • X-ray diffraction (XRD) / reflectometry (XRR) / small-angle scattering (GISAXS)

Contact

Dr. Stefan Facsko

Head of Ion Beam Center
s.facskoAthzdr.de
Phone: +49 351 260 2987