Microstructural investigation of Sn nanoclusters in double-energy implanted and annealed SiO2 layers with cross-sectional TEM
Microstructural investigation of Sn nanoclusters in double-energy implanted and annealed SiO2 layers with cross-sectional TEM
Markwitz, A.; Grötzschel, R.; Heinig, K.-H.; Rebohle, L.; Skorupa, W.
- Nuclear Instruments and Methods in Physics Research B 152 (1999) 319-324
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