Axial heterostructures in vapor-liquid-solid grown nanowires: at the limit of interface sharpness


Axial heterostructures in vapor-liquid-solid grown nanowires: at the limit of interface sharpness

Hilliard, D.; Tauchnitz, T.; Hübner, R.; Vasileiadis, I.; Dimitrakopulos, G.; Komninou, P.; Winnerl, S.; Schneider, H.; Helm, M.; Dimakis, E.

When lowering the dimensions of semiconductor heterostructures, controlled compositional changes become paramount owing to the increasing role of the heterointerfaces in the electronic properties of the heterostructures. A common issue faced in fabricating axial heterostructures in vapor-liquid-solid (VLS)-grown nanowires is the compositional grading, which is caused by the involved growth mechanisms and broadens the interfaces.
Here, our previously developed nanowire growth technique called droplet-confined alternate pulsed-epitaxy (DCAPE) [1] (an adaptation of conventional molecular beam epitaxy), which grants precise control over the axial growth rate and droplet composition, is employed to grow AlxGa1-xAs axial insertions in self-catalyzed GaAs nanowires. Some examples showcasing the capability of DCAPE in growing systems of complex, abrupt heterostructures are shown in Fig. 1a, where AlxGa1-xAs is revealed as horizontal dark grey lines. High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and a semi-empirical growth model [2] are utilized to gain an understanding of the compositional grading mechanism and its dependence on the growth temperature (TG), the nanowire radius (RNW), and the total Al content [2]. We show that pre-filling the Ga droplet with Al before the growth of an insertion is enough to sharpen the GaAs-to-AlxGa1-xAs interface at any TG. On the other hand, though, sharper AlxGa1-xAs-to-GaAs interfaces are obtained only at lower TG and/or smaller RNW, where the so-called reservoir effect is markedly reduced. In the best case, symmetric AlxGa1-xAs insertions with interface widths of only 2– 3 monolayers (comparable to, or better than, state-of-the-art thin film heterostructures) are achieved for the full range of x (Fig. 1b), proving the strength of VLS in the fabrication of sharp axial heterostructures.

Figure 1: (a) HAADF-STEM images with 5 examples of GaAs/AlxGa1-xAs heterostructures grown in self-catalyzed GaAs nanowires. Dark contrast denotes Al-containing regions. (b) Symmetric AlxGa1-xAs profiles obtained after optimization of all growth parameters.

[1] L. Balaghi et al., Nano Lett. 16, 4032 (2016).
[2] D. Hilliard et al., in preparation.

Involved research facilities

Related publications

  • Lecture (Conference)
    Nanowire Week 2023, 09.10.2023, Atlanta, Georgia, USA

Permalink: https://www.hzdr.de/publications/Publ-38269