Tellurium hyperdoped Si


Tellurium hyperdoped Si

Zhou, S.

Tellurium is one of the deep-level impurities in Si, leading to states of 200-400 meV below the conduction band. Non-equilibrium methods allow for doping deep-level impurities in Si well above the solubility limit, referred as hyperdoping, that can result in exotic properties, such as extrinsic photo-absorption well below the Si bandgap [1]. In this talk, we will present an overview about Te hyperdoped Si. The hyperdoping is realized by ion implantation and pulsed laser melting. We will present the resulting optical, electrical properties and the perspective applications as infrared photodetectors. With increasing the Te concentration, the samples undergo an insulator to metal transition [2, 3]. Surprisingly, the electron concentration obtained in Te-hyperdoped Si is approaching 1021 cm-3 and does not show saturation [4]. It is even high than that of P or As doped Si and potentially meets the criteria of source/drain applications in future nanoelectronics. The infrared optical absorptance is found to increase with increasing dopant concentration [2]. We demonstrate the room-temperature operation of a mid-infrared photodetector based on Te-hyperdoped Si. The key parameters, such as the detectivity, the bandwidth and the rise/fall time, show competitiveness with the commercial products [5]. To understand the microscopic picture, we have performed Rutherford backscattering angular scans and first-principles calculations [4]. The Te-dimer complex sitting on adjacent Si lattice sites has the smallest formation energy and is thus the preferred configuration at high doping concentration. Those substitutional Te-dimers are effective donors, leading to the insulator-to-metal transition, the non-saturating carrier concentration as well as the sub-band photoresponse. Moreover, the Te-hyperdoped Si layers exhibit thermal stability up to 400 °C with a duration of at least 10 minutes [6]. Therefore, Te-hyperdoped Si presents a test-bed for electrical and optical applications utilizing deep-level impurities.
[1] J. M. Warrender, Laser hyperdoping silicon for enhanced infrared optoelectronic properties, Appl. Phys. Rev. 3, 031104 (2016).
[2] M. Wang, et al., Extended Infrared Photoresponse in Te-Hyperdoped Si at Room Temperature, Phys. Rev. Appl. 10, 024054 (2018).
[3] M. Wang, et al., Critical behavior of the insulator-to-metal transition in Te-hyperdoped Si, Phys. Rev. B 102, 085204 (2020).
[4] M. Wang, et al., Breaking the doping limit in silicon by deep impurities, Phys. Rev. Appl. 11, 054039 (2019).
[5] M. Wang, et al., Silicon-Based Intermediate-Band Infrared Photodetector Realized by Te Hyperdoping, Adv. Opt. Mater. 9, 2001546, (2020).
[6] M. Wang, et al., Thermal stability of Te-hyperdoped Si: Atomic-scale correlation of the structural, electrical, and optical properties, Phys. Rev. Mater. 3, 044606 (2019).

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