Electrical characterization of multi-gated WSe2/MoS2 van der Waals heterojunctions


Electrical characterization of multi-gated WSe2/MoS2 van der Waals heterojunctions

Chava, P.; Kateel, V.; Watanabe, K.; Tanihushi, T.; Helm, M.; Mikolajick, T.; Erbe, A.

Transistor measurements

Keywords: 2D-materials; heterostructures; transistors

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Permalink: https://www.hzdr.de/publications/Publ-38985