A Low Energy Ion Beam Line for Highly Charged Ions


A Low Energy Ion Beam Line for Highly Charged Ions

Zschornack, G.; Landgraf, S.; Großmann, F.; Kentsch, U.; Ovsyannikov, V. P.; Schmidt, M.; Ullmann, F.

An ion beam line is presented, which is designed to study the interaction of highly charged ions with matter, especially solid surfaces. The highly charged ions are produced in a room temperature electron beam ion trap, the Dresden EBIT. This device delivers bare nuclei up to elements with an atomic number of about 28, and neon-like ions up to about Z=80. After leaving the trap the ion beam containing several neighbouring ion charge states passes through standard ion optics elements before entering an analysing magnet for separating a certain ion charge state. In a following deceleration unit, which will be integrated soon, the ions can be slowed down to a definite kinetic energy of a few eV. The characteristic of the HCI beam is presented, combined with ion extraction spectra of selected elements detected by a Faraday cup after passing through an analysing magnet.

Keywords: Highly Charged Ions; Electron Beam Ion Trap

  • Vacuum 78(2005)2-4, 319-323

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