SEM-Laboratory

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Bild: REM Zeiss EVO 50
REM Zeiss EVO 50
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SEM Zeiss EVO 50

  • Tungsten cathode
  • Acceleration voltage 0.2 - 30 kV
  • Resolution: 3 nm at 30 kV
  • Detectors:
    • Everhart-Thornley secondary electron detector
    • 4 quadrant backscatter electron detector
  • Chamber: diameter: 365 mm; high: 255 mm
  • 5-Axes motorised compucentric specimen stage
 

EDX: Bruker AXS QUANTAX 200

  • Light element detector X-Flash 4010
  • Energy resolution 127 eV
 

Cressington DUAL Coating System 108a/c

  • Cressington 108auto sputter coater  ( → thin layer of gold)
  • Cressington 108carbon/A carbon coater  ( → thin layer of carbon)

Application fields

  • Fractography of unirradiated and irradiated specimens of reactor pressure vessel steels and other materials
  • Characterization of surface structures of different materials
  • Visualization and element analysis of insulation debris and corrosion products for investigation of chemical effects during LOCA incidents in NPP
  • Investigation of bacteria and biofilms
  • EBSD on SEM Zeiss NVision 40 with Bruker e-FlashHR- detector and QUANTAX CrystAlign EBSD-system