Contact

Dr. René Hübner
Electron Microscopy Laboratory
Structural Analysis
r.huebnerAthzdr.de
Phone: +49 351 260 3174
Fax: +49 351 260 13174

Analytical Transmission Electron Microscopy - Equipment - Titan 80-300 (FEI) - Talos F200X (FEI) - Topics of Research:...

Shaping of Co-Pt particles in an silicon oxide matrix during thermal treatment and ion irradiation

BF-TEM Co-Pt

Fig. 1. Cross-sectional TEM bright-field image of an SiO2 quartz glass sample implanted with cobalt and platinum followed by a thermal treatment at 1000 °C and an irradiation process with 4 MeV Si+ beam at 300 °C.

HAADF Co-Pt

Fig. 2. Cross-sectional HAADF-STEM image with the EDXS analysis position marked by a red square.

EDXS Co-Pt

Fig. 3. EDX spectrum of the position marked with a red square in Fig. 2. Besides cobalt and platinum from the particle, silicon and oxygen from the quartz substrate are detected.


Contact

Dr. René Hübner
Electron Microscopy Laboratory
Structural Analysis
r.huebnerAthzdr.de
Phone: +49 351 260 3174
Fax: +49 351 260 13174