Contact

Dr. René Hübner

Head Structural Analysis
Electron Microscopy Laboratory
r.huebnerAthzdr.de
Phone: +49 351 260 3174

Analytical Transmission Electron Microscopy (TEM) is used for analysis of

  • Phase formation in nanomaterials
  • Structure of thin layers including surface and interface roughness
  • Element composition in the nanometer range

Phase separation into percolated Si nanostructures in SiO2

BF-TEM Si-SiOx overview

Fig. 1. Cross-sectional TEM bright-field image of a Si-SiOx nano-composite layer deposited onto single-crystalline silicon.

BF-TEM Si-SiOx HRTEM

Fig. 2. High-resolution zero-loss image of the interface between the Si-SiOx nano-composite and the silicon substrate.

EFTEM Si-SiOx Si+SiOx

Fig. 3. Superposition of Si (green) and SiOx distributions (red) obtained by EFTEM.


Contact

Dr. René Hübner

Head Structural Analysis
Electron Microscopy Laboratory
r.huebnerAthzdr.de
Phone: +49 351 260 3174

 
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