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Hydrogen storage in Mg2FeSi alloy thin films depending on the Fe-to-Si ratio measured by conversion electron Mössbauer spectroscopy

Trinh, T. T.; Asano, K.; Heller, R.; Reuther, H.; Grenzer, J.; Schreuders, H.; Dam, B.; Potzger, K.


Sputter deposited Mg2FexSi1-x films of 250 nm thickness have been investigated by means of Mössbauer spectroscopy. While non-hydrogenated films are characterized by a quadrupole split doublet, hydrogenated regions show a singlet with reduced isomer shift. The relative areas of the spectra reflect the relation between loaded and unloaded regions prepared at the same loading conditions.

Keywords: Hydrogen storage; MgFe; Mössbauer

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