Publications Repository - Helmholtz-Zentrum Dresden-Rossendorf
3 PublicationsCharacterization of Defects in Ion Implanted SiC by Slow Positron Implantation Spectroscopy and Rutherford Backscattering
Anwand, W.; Brauer, G.; Coleman, P. G.; Voelskow, M.; Skorupa, W.
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Applied Surface Science 149 (1999) 148-150
DOI: 10.1016/S0169-4332(99)00191-9
Cited 3 times in Scopus -
Lecture (Conference)
8th Int. Workshop on Slow Positron Beam Techniques for Solids and Surfaces (SLOPOS-8), Cape Town, Sept. 6 - 12, 1998 -
Lecture (Conference)
30th Polish Seminar on Positron Annihilation, Jarnoltowek, Sept. 17-21, 1998
Permalink: https://www.hzdr.de/publications/Publ-1291