Publications Repository - Helmholtz-Zentrum Dresden-Rossendorf
1 PublicationFocused ion beam induced structural modifications in thin magnetic films.
Roshchupkina, O. D.; Grenzer, J.; Strache, T.; McCord, J.; Fritzsche, M.; Mücklich, A.; Baehtz, C.; Fassbender, J.
Abstract
Focused ion beam techniques are one way to modify locally the properties of magnetic thin films. We report on structural investigations of 50 nm thick non-ordered nano-crystalline Permalloy (Ni81Fe19) films modified by 30 keV Ga+ focused ion beam (FIB) irradiation. From the X-ray diffraction (XRD) measurements a considerable crystallite growth and a material texturing towards (111)-direction with a linearly increasing lattice constant was observed. In addition cross-sectional transmission electron microscope (XTEM) images show that crystallites are growing through the entire film at high irradiation fluences.
Extended X-ray absorption fine structure (EXAFS) analysis shows a perfect near-order coordination corresponding to a face-centered (fcc) unit cell for both FeNi and Ga atom surrounding. The structural changes are accompanied by a decrease of saturation polarization with increasing ion fluence. Such behavior is attributed to a simple incorporation of non-magnetic Ga atoms in the Permalloy film.
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
- Rossendorf Beamline at ESRF DOI: 10.1107/S1600577520014265
Related publications
- DOI: 10.1107/S1600577520014265 is cited by this (Id 17321) publication
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 17321) publication
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Journal of Applied Physics 112(2012)3, 033901
DOI: 10.1063/1.4739302
Cited 9 times in Scopus
Permalink: https://www.hzdr.de/publications/Publ-17321