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The application of deep learning on slit-scan images processing and emittance prediction

Ma, S.; Arnold, A.; Ryzhov, A.; Schaber, J.; Petr, M.; Paul, Z.; Teichert, J.; Xiang, R.

Abstract

The radiation source ELBE (Electron Linac for beams with high Brilliance and low Emittance) delivers multiple secondary beams, both electromagnetic radiation, and particles. To measure beam emittance effectively before user time, a fast and accurate method, the continue moving slit-scan system for high bunch charge has been developed. To accelerate the process of the images, the parallel algorithm, images classification Convolutional Neural Network (CNN), and autoencoder network are used.

Keywords: emittance; slit-scan; deep learning

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Permalink: https://www.hzdr.de/publications/Publ-32945