Contact

Dr. René Hübner

Electron Microscopy Laboratory
Structural Analysis
r.huebnerAthzdr.de
Phone: +49 351 260 3174

Structure Analysis

The group Structure Analysis deals with the analysis of the structural, morphological, and chemical properties of nanostructured materials, in particular of (ion-modified) solid surfaces and thin film systems. For this purpose, analytical techniques using the interaction of electrons and X-ray beams with the nanomaterials are applied.

Methods available in Structure Analysis:

The equipment is significantly used for investigations of samples from other institutes of the HZDR. The specific sample preparation (especially for electron microscopy) is performed in the department.

Foto: Titan 80-300 ©Copyright: René Hübner

Analytical Transmission Electron Microscopy

Analytical Transmission Electron Microscopy (TEM) is used for analysis of

- Phase analysis/ phase formation and lattice disortion in layer structures
- Structure of thin films and their interface
- Element composition in microregions
- Surface and interface roughness
Foto: REM2

Scanning Electron Microscopy

Analytical scanning electron microscopy (SEM) is used to analyse the

- Structure of thin films and their interface
- Element composition in microregions
Foto: AES 1

Auger electron spectroscopy

Auger electron spectroscopy (AES) is used to analyse element composition in microregions
Foto: Emyprean th-th Diffractometer with High-Temperature Chamber ©Copyright: J.Grenzer

X-ray Laboratory

X-ray diffraction (XRD) and X-ray reflectometry (XRR) are used for the analysis of the structure of thin films and their interfaces. In addition, XRD is used for Phase analysis/ phase formation and lattice disortion in layer structures and XRR for Surface and interface roughness.

Group information:

Group members - Structural Analysis

Current group members

Contact

Dr. René Hübner

Electron Microscopy Laboratory
Structural Analysis
r.huebnerAthzdr.de
Phone: +49 351 260 3174