Dr. René Hübner

Head Structural Analysis
Electron Microscopy Laboratory
Phone: +49 351 260 3174

Electron microscopy laboratory


Foto: REM ©Copyright: Dr. René Hübner

Scanning Electron Microscopy

Analytical scanning electron microscopy (SEM) is used to analyse the

  • Surface and interface structure
  • morphology of materials
  • Element composition in the micro and nanometer range
Foto: Titan 80-300 ©Copyright: René Hübner

Analytical Transmission Electron Microscopy

Analytical Transmission Electron Microscopy (TEM) is used for analysis of

  • Phase formation in nanomaterials
  • Structure of thin layers including surface and interface roughness
  • Element composition in the nanometer range