Analytical Transmission Electron Microscopy
Equipment
Topics of Research
The TEM is mainly used for the investigation of the effects of ion implantation and layer deposition on the micro- and nano-scale. Due to the primary interest on depth profiles, cross-sectional specimens prepared in our own TEM laboratory are mainly analyzed. Besides classical TEM specimen preparation (sawing, grinding, polishing, dimpling, and Ar ion milling), target preparation can be done using a focused ion beam device (FIB, Helios 5 CX). The TEM is open for performing all relevant tasks at HZDR as well as to partners in academics and industry. Currently, contributions to the following topics are delivered:
- Verification of shaping effects of nano-particles by ion irradiation
- Ion-beam induced surface modification
- Analysis of semiconductor structures
- Characterization of advanced absorber materials for photovoltaics
- Analysis of modern materials for batterie technology
- Incorporation and binding of uranium in microorganisms (cooperation with Institute of Resource Ecology)