Nano testing lab
The nano testing lab is equipped with a nanomechanics test device for depth-sensing nanoindentation and an atomic force microscope (AFM). The AFM can be run either in combination with the nanomechanics tester for the purpose of indentation imaging or as a stand-alone device.
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Universal nanomechanics tester – UNAT (ASMEC)
- Digital force resolution <100 nN
- Digital displacement resolution <50 pm
- Noise of force measurement <10 µN
- Noise of displacement measurement <1 nm
- x-y-z positioning device:
- Travelling range 200 mm x 50 mm x 50 mm
- Step size 0,5 µm x 0,1 µm x 0,1 µm
- Tandem microscope (optical)
- Berkovich indenter
- Thermal and electrical isolation
- Active vibration suppression
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Atomic force microscope Nanite B (Nanosurf)
- x-y-z scanning range 110 µm x 110 µm x 20 µm
- Contact mode and dynamic mode
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