Nano testing lab

The nano testing lab is equipped with a nanomechanics test device for depth-sensing nanoindentation and an atomic force microscope (AFM). The AFM can be run either in combination with the nanomechanics tester for the purpose of indentation imaging or as a stand-alone device.


Universal nanomechanics tester – UNAT (ASMEC)

  • Digital force resolution <100 nN
  • Digital displacement resolution <50 pm
  • Noise of force measurement <10 µN
  • Noise of displacement measurement <1 nm
  • x-y-z positioning device:
    1. Travelling range 200 mm x 50 mm x 50 mm
    2. Step size 0,5 µm x 0,1 µm x 0,1 µm
  • Tandem microscope (optical)
  • Berkovich indenter
  • Thermal and electrical isolation
  • Active vibration suppression

Atomic force microscope Nanite B (Nanosurf)

  • x-y-z scanning range 110 µm x 110 µm x 20 µm
  • Contact mode and dynamic mode