Setups - FWIZ-N
List of our setups for material modification, imaging, analytical methods and preparation.
Modification
Instrument |
Functionality |
Contact |
OrsayFIB |
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OrsayFIB - Photo: Nico Klingner |
HV-setup for focussed ion beams:
|
Nico Klingner Lothar Bischoff |
CANION FIB |
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CANION FIB - Photo: Nico Klingner |
HV-setup for focussed ion beams:
|
Lothar Bischoff Nico Klingner |
Orion NanoFab |
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Orion NanoFab Photo: Gregor Hlawacek |
Helium ion microscope:
|
Gregor Hlawacek |
NVision 40 |
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NVision 40 - Photo: Lothar Bischoff |
HV-setup for focussed ion and electron beams:
|
Lothar Bischoff |
Orion Plus |
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Orion Plus - Photo: Gregor Hlawacek |
Helium ion microscope:
|
Gregor Hlawacek |
HCI |
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HCI - Photo: Sascha Creutzburg |
UHV setup for highly charged ions:
|
René Heller |
LEI |
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LEI Photo: Parminder Singh |
HV-setup for low energy ion irradiation:
|
Denise Erb |
Imaging
Instrument |
Functionality |
Contact |
Olympus Ultra Objective |
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Olympus Ultra Objective Photo: Nico Klingner |
Atomic force microscope:
|
Lothar Bischoff |
Bruker Multimode 8 AFM |
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Bruker Multimode 8 AFM Photo: Parminder Singh |
Atomic force microscope:
|
Denise Erb |
Omicron UHV AFM / STM |
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Omicron UHV AFM / STM Photo: Parminder Singh |
UHV atomic force / scanning transmission microscope:
|
Stefan Facsko |
Orion NanoFab |
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Orion NanoFab Photo: Gregor Hlawacek |
Helium ion microscope:
|
Gregor Hlawacek |
Orion Plus |
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Orion Plus - Photo: Gregor Hlawacek |
Helium ion microscope:
|
Gregor Hlawacek |
NVision 40 |
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NVision 40 - Photo: Lothar Bischoff |
HV-setup for focussed ion beams and electron beams:
|
Lothar Bischoff |
NanoSAM |
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NanoSAM - Photo: Denise Erb |
UHV-setup for electron microscopy:
|
Denise Erb |
Analytics
Instrument |
Functionality |
Contact |
TestFIB |
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TestFIB - Photo: Nico Klingner |
UHV-setup for LMAIS (Liquid Metal Alloy Ion Sources) characterization:
|
Lothar Bischoff Nico Klingner |
NVision 40 |
||
NVision 40 - Photo: Lothar Bischoff |
HV-setup for focussed ion beams and electron beams:
|
Lothar Bischoff |
Orion NanoFab |
||
Orion NanoFab Photo: Gregor Hlawacek |
Helium ion microscope:
|
Gregor Hlawacek |
HCI |
||
HCI - Photo: Sascha Creutzburg |
UHV setup for highly charged ions:
|
René Heller |
NanoSAM |
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NanoSAM - Photo: Denise Erb |
UHV-setup for surface analytics:
|
Denise Erb |
Preparation
Instrument |
Functionality |
Contact |
Spot Welder |
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Spot welder. Photo: Lothar Bischoff |
Spot welding device:
|
Lothar Bischoff Wolfgang Pilz |
Etching Setup |
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Etching setup - Photo: Nico Klingner |
Etching setup:
|
Lothar Bischoff Wolfgang Pilz Nico Klingner |
Leica EM TXP |
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Leica EM TXP Photo: Nico Klingner |
Mechanical preparation:
|
Nico Klingner |
ArBlade 5000 CTC |
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ArBlade - Photo: Nico Klingner |
HV-device for ion beam milling:
|
Nico Klingner |
LMAIS Präparation |
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LMAIS Preparation Photo: Nico Klingner |
HV-device for LMAIS (Liquid Metal Alloy Ion Sources) preparation:
|
Lothar Bischoff Wolfgang Pilz Nico Klingner |