Publications - Ion implantation and modification of materials
Here you are finding current publications that have emerged from user experiments and collaborations with the "Ion implantation and modification of materials" group.
Publikations FWIZ-I
Year from 2023
"Online First" included
First HDZR Author OU: Implanter (FWIZ-I)
Electrical, photocatalytic, and sensory properties of graphene oxide and polyimide implanted with low- and medium-energy silver ions
Novák, J.; Štěpanovská, E.; Malinský, P.; Mazánek, V.; Luxa, J.; Kentsch, U.; Sofer, Z.
Abstract
Precise control of electrical conductivity, humidity sensitivity, and photocatalytic activity in polymeric and carbon-based materials is essential for advancing technologies in environmental sensing, flexible electronics, and photocatalytic systems. Conventional chemical modification methods often lack spatial precision, introduce impurities, and risk structural degradation. Ion implantation provides a controllable alternative for tuning surface properties at the nanoscale, enabling the targeted introduction of functional species without chemical reagents. This work investigates the effects of low-energy (20 keV) and medium-energy (1.5 MeV) Ag+ ion implantation on the electrical, sensory, and photocatalytic properties of graphene oxide (GO) and polyimide (PI). Implantations were carried out with fluences ranging from 3.75 × 1012 cm−2 to 1 × 1016 cm−2. Silver ions offer excellent electrical, catalytic, and plasmonic characteristics, making them ideal for multifunctional enhancement of GO and PI. Elemental and structural changes induced by implantation were analyzed using Rutherford backscattering spectroscopy, elastic recoil detection analysis, Raman spectroscopy, Fourier-transform infrared spectroscopy, and X-ray photoelectron spectroscopy. Surface morphology was assessed via atomic force microscopy. Electrical properties as a function of air humidity were evaluated using a two-point method, and photocatalytic activity was tested by monitoring the UV-induced decomposition of rhodamine B. The results demonstrate that ion implantation significantly reduces surface resistivity and enhances both the photocatalytic activity and humidity sensitivity of GO and PI. The most pronounced improvements occurred at higher fluences, where defect generation and partial deoxygenation contributed to optimal performance. Ion implantation thus represents an effective approach for tuning the multifunctional behavior of polymer systems.
Keywords: ERDA; graphene oxide; ion implantation; photocatalysis; polyimide; RBS
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 42667) publication
-
Beilstein Journal of Nanotechnology 16(2025), 1794-1811
DOI: 10.3762/bjnano.16.123
Permalink: https://www.hzdr.de/publications/Publ-42667
High-temperature He + Irradiation of Low-iron-bearing Olivine: Laboratory Simulations of Space Weathering on Mercury
Snata Rout, S.; Kentsch, U.; Dohmen, R.; Traeger, F.; Prava Das, S.; Becker, H.-W.; Facsko, S.; Ritter, M.
Abstract
The surface of Mercury is highly space weathered, and the products of space weathering are different than on the Moon. Here we simulate the interaction of solar wind ions with the surface of Mercury by implanting low-iron-bearing (∼3 wt% Fe) olivine slices with 4 keV He+ ions both under ambient conditions and at 450 °C during the irradiation. The sample irradiated under ambient conditions shows a ∼140 nm thick partially amorphous layer on top of the grain with high concentrations of bubbles and cavities. However, the sample irradiated at 450 °C has a 110–140 nm thick polycrystalline layer with 1–5 nm sized nanoparticles of metallic iron and no bubbles or cavities. Mg atoms are preferentially sputtered from the ion-damaged layer present on the sample irradiated under ambient conditions, but no difference in composition is seen between the crystalline olivine and the ion-damaged layer in the sample irradiated at 450 °C. In addition, a thin amorphous film deposited on a micro-electromechanical systems–based chip is heated up to 1200 °C in situ inside a transmission electron microscope for a few milliseconds, and it produced nanoparticles of size 5–30 nm. Our results show that solar wind irradiation of low-iron-bearing olivine in the equatorial regions of Mercury will produce nanoparticles of iron whose sizes will be larger than that on the surface of the Moon and that the size will further increase during impacts of dust particles. Solar-wind-implanted He can diffuse out of regolith grains and can be a source of He observed in the exosphere of Mercury.
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 42290) publication
-
The Planetary Science Journal 6(2025), 269
DOI: 10.3847/PSJ/ae172f
Permalink: https://www.hzdr.de/publications/Publ-42290
Photon Emission Gain in Er-Doped Si Light-Emitting Diodes by Impact Excitation
Liu, H.; Zhao, J.; Zhang, J.; Liu, H.; He, J.; Kentsch, U.; Zhou, S.; Helm, M.; Dan, Y.
Abstract
This work demonstrates photon emission gain, i.e., emission of multiple photons per injected electron, through impact excitation in Er-doped silicon light-emitting diodes (LEDs). Conventional methods for exciting Er ions in silicon suffer from low efficiency due to mismatched energy transfer between exciton recombination and Er excitation. Here, we propose a reverse-biased Si PN junction diode, where ballistically acceleratedelectrons induce inelastic collisions with Er ions, enabling tunable excitation via electric field modulation. Theoretical modeling reveals that photon emission gain arises from multiple impact excitations by a single electron traversing the electroluminescence region, with the gain value approximating the ratio of emission region width to electron mean free path, i.e., G= Lex/ . Experimental results show an internal quantum efficiency (IQE) of 1.84% at 78 K, representing a 20-fold enhancement over the room-temperature performance. This work provides a critical foundation for on-chip integration of silicon-based communication-band lasers and quantum light sources.
Keywords: emission gain; impact excitation; Er-doped Si; C-band LED
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 42250) publication
-
ACS Photonics 12(2025), 5782-5787
DOI: 10.1021/acsphotonics.5c01769
Downloads
- Secondary publication expected from 23.09.2026
Permalink: https://www.hzdr.de/publications/Publ-42250
A novel approach towards robust construction of physical colors on lithium niobate crystal
Yang, Q.; Yu, M.; Chen, Z.; Ai, S.; Kentsch, U.; Zhou, S.; Jia, Y.; Chen, F.; Liu, H.
Abstract
Controlling the construction of physical colors on the surfaces of transparent dielectric crystals is crucial for surface coloration and anti-counterfeiting applications. In this study, we present a novel approach to creating stable physical colors on the surface of lithium niobate crystals by combining gold ion implantation with laser direct writing technologies. The interaction between the laser, the implanted gold nanoparticles, and the crystal lattice induces permanent, localized modifications on the crystal surface. By fine-tuning the laser direct writing parameters, we reshaped the gold nanoparticles into spheres of varying sizes on the crystal surface, resulting in the display of red, green, blue, and pale-yellow colors. We investigated the influence of the implanted Au nanoparticles—particularly their localized surface plasmon resonances—on the modifications of the lithium niobate crystal lattice during the laser writing process using confocal Raman spectroscopy and high-resolution transmission electron microscopy. Our findings reveal that the embedded Au nanoparticles play a pivotal role in altering the conventional light-matter interaction between the crystal lattice and the laser, thereby facilitating the generation of surface colors. This work opens new avenues for the development of vibrant surface colors on transparent dielectric crystals.
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 41232) publication
-
Opto-Electronic Advances 8(2025), 240193
DOI: 10.29026/oea.2025.240193
Cited 52 times in Scopus
Permalink: https://www.hzdr.de/publications/Publ-41232
Anisotropy of radiation-induced defects in Yb-implanted β-Ga₂O₃
Ratajczak, R.; Sarwar, M.; Kalita, D.; Jozwik, P.; Mieszczynski, C.; Matulewicz, J.; Wilczopolska, M.; Wozniak, W.; Kentsch, U.; Heller, R.; Guziewicz, E.
Abstract
RE-doped β-Ga₂O₃ seems attractive for future high-power LEDs operating in high irradiation environments. In this work, we pay special attention to the issue of radiation-induced defect anisotropy in β-Ga₂O₃, which is crucial for device manufacturing. Using the RBS/c technique, we have carefully studied the structural changes caused by implantation and post-implantation annealing in two of the most commonly used crystallographic orientations of β-Ga₂O₃, namely the (-201) and (010). The analysis was supported by advanced computer simulations using the McChasy code. Our studies reveal a strong dependence of the structural damage induced by Yb-ion implantation on the crystal orientation, with a significantly higher level of extended defects observed in the (-201) direction than for the (010). In contrast, the concentration and behavior of simple defects seem similar for both oriented crystals, although their evolution suggests the co-existence of two different types of defects in the implanted zone with their different sensitivity to both, radiation and annealing. It has also been found that Yb ions mostly occupy the interstitial positions in β-Ga₂O₃ crystals that remain unchanged after annealing. The location is independent of the crystal orientations. We believe that these studies noticeably extend the knowledge of the radiation-induced defect structure, because they dispel doubts about the differences in the damage level depending on crystal orientation, and are important for further practical applications.
Keywords: Wide bandgap semiconductors; Gallium oxide; Ion implantation; Radiation defects; Rutherford Backscattering Spectrometry; Channeling
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39944) publication
-
Scientific Reports 14(2024), 24800
DOI: 10.1038/s41598-024-75187-6
Cited 7 times in Scopus
Permalink: https://www.hzdr.de/publications/Publ-39944
Chromium agglomeration induced by Fe+ ion irradiation of Fe-10at%Cr
Pantousa, S.; London, A. J.; Mergia, K.; Ionescu, A.; Manios, E.; Tsavalas, P.; Dellis, S.; Kinane, C.; Langridge, S.; Caruana, A.; Kentsch, U.; Messoloras, S.
Abstract
Fe-Cr alloys serve as model alloys for the investigation of radiation induced effects in ferritic-martensitic steels which are candidate structural materials for future fusion reactors. In this work the effect of Cr segregation and/ or agglomeration in 490 keV Fe+ ion irradiated Fe-10at%Cr alloys in the form of thin films is investigated. The irradiations took place at 300 ◦C at doses ranging from 0.5 to 20 displacements per atom (dpa). Polarized Neutron Reflectivity (PNR) measurements were used for the determination of the solute Cr concentration in the Fe-Cr matrix. Cr depletion from the Fe-Cr matrix up to 2.4 at% was found. This is related to solute Cr decrement as the accumulated dose increases. After the damage of 4 dpa, solute Cr reaches the asymptotic value of 8.4 at%, close to that of the thermodynamic equilibrium in Fe-Cr. Atom Probe Tomography (APT) measurements showed that after irradiation Cr accumulates into clusters the majority of which is co-located with oxygen.
Keywords: Fe-Cr alloys; Ion irradiation; Cr depletion; Polarized neutron reflectivity; Atom probe tomography
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39525) publication
-
Nuclear Materials and Energy 39(2024), 101680
DOI: 10.1016/j.nme.2024.101680
Cited 2 times in Scopus
Permalink: https://www.hzdr.de/publications/Publ-39525
The Influence of Crystal Orientation and Thermal State of a Pure Cu on the Formation of Helium Blisters
Shtuckmeyster, D.; Maman, N.; Vaknin, M.; Zamir, G.; Zenou, V. Y.; Kentsch, U.; Dahan, I.; Shneck, R. Z.
Abstract
The factors that influence the formation of helium blisters in copper were studied, including crystallographic grain orientation and thermomechanical conditions. Helium implantation experiments were conducted at 40 KeV with a dose of 5 × 10¹⁷ ions/cm², and the samples were then subjected to post-implantation heat treatments at 450 °C for different holding times. A scanning electron microscope (SEM) equipped with an electron backscatter diffraction (EBSD) detector was used to analyze the samples, revealing that the degree of blistering erosion and its evolution with time varied with the crystallographic plane of the free surface in different ways in annealed and cold rolled copper. Out of the investigated states, rolled copper with a (111) free surface had superior helium blistering durability. This is explained by the consideration of the multivariable situation, including the role of dislocations and vacancies. For future plasma-facing component (PFC) candidate material, similar research should be conducted in order to find the optimal combination of material properties for helium blistering durability. In the case of Cu selection as a PFC, the two practical approaches to obtain the preferred (111) orientation are cold rolling and thin layer technologies.
Keywords: plasma-facing components; helium blistering; thermo-mechanical state; crystal orientation; dislocati
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39524) publication
-
Metals 14(2024)3, 260
DOI: 10.3390/met14030260
Cited 1 times in Scopus
Permalink: https://www.hzdr.de/publications/Publ-39524
Depth-distribution of resistivity within ion-irradiated semiconductor layers revealed by low-kV scanning electron microscopy
Jóźwik, I.; Jagielski, J.; Ciepielewski, P.; Dumiszewska, E.; Piętak-Jurczak, K.; Kamiński, M.; Kentsch, U.
Abstract
Low-kV scanning electron microscopy imaging was used to visualize the 2D profiles of internal resistivity distribution in 600 keV He2+ ion-irradiated epitaxial GaAs and Al(0.55)Ga(0.45)As. The influence of the dopant concentration on DIVA (damage-induced voltage alteration) contrast formation has been studied in this paper. The threshold irradiation fluencies (the fluencies below which no damage-related contrast is observed) were defined for each studied material. The results show that the same level of damage in the material caused by ion irradiation becomes visible at lower threshold fluence in the case of lower-doped sample of the same composition. The aluminum content in the composition of materials exposed to ion irradiation and subsequent DIVA contrast formation mechanism was considered as well. The carrier concentration in irradiated layers has been studied by Raman spectroscopy and photoluminescence measurements, which confirmed that the increase of the resistivity of the material caused by ion-irradiation damage generation is resulting from the formation of deep states in the bandgap trapping free carriers.
Keywords: AIIIBV; Ion damage; Low-kV SEM
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39046) publication
-
Materials Science in Semiconductor Processing 165(2023), 107640
DOI: 10.1016/j.mssp.2023.107640
Permalink: https://www.hzdr.de/publications/Publ-39046
Approaching the Curie temperature of ferromagnetic (Ga,Mn)P prepared by ion implantation and pulsed laser melting
Tian, M.; Yang, Q.; Yuan, Y.; Kentsch, U.; Liu, K.; Tang, M.; Xie, Z.; Li, L.; Wang, M.
Abstract
This work aims to estimate the Curie temperature and critical exponents in the critical regime of III-V ferro- magnetic semiconductor (FS) (Ga,Mn)P film using various methods, including Arrott and Kouvel-Fisher plots, as well as electrical transport measurements. The (Ga,Mn)P film was prepared by implanting Mn ions into an intrinsic (001) GaP wafer, followed by pulsed laser melting (PLM). The magnetic properties of the (Ga,Mn)P layer were systematically investigated. The study investigated the accuracy of four different methods in deter- mining the critical behaviors for the magnetic properties close to TC. The results suggest that the critical ex- ponents are similar to those of the mean-field model, as indicated by the modified Arrot plots and temperature dependent effective critical exponents. However, the accuracy of the temperature-dependent resistance Rₓₓ(T) method and Kouvel-Fisher (K-F) analysis is limited due to the Gaussian distribution of Mn ions in the film.
Keywords: Magnetic properties; Ion implantation; Electrical transport; Ferromagnetic; III-V ferromagnetic semiconductors
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39045) publication
-
Results in Physics 58(2024), 107508
DOI: 10.1016/j.rinp.2024.107508
Permalink: https://www.hzdr.de/publications/Publ-39045
Prior implantation of hydrogen as a mechanism to delay helium bubbles, blistering, and exfoliation in titanium
Fink Ilyasafov, S.; Maman, N.; Kentsch, U.; Zenou, V. Y.; Vaknin, M.; Rakita, Y.; Zamir, G.; Dahan, I.; Shneck, R. Z.
Abstract
This study explores the delaying of the formation of helium bubbles and blisters in pure titanium by hydrogen pre-implantation. Titanium, implanted with helium (40 KeV, 5 × 10¹⁷ ions/cm²), exhibited large bubbles that cause exfoliation after heat treatment, whereas hydrogen pre-implantation inhibited bubble growth at room temperature and reduced the exfoliation after heat treatment.
In the samples pre-implanted with hydrogen, we found evidence of helium diffusion delay by: (a) a fourfold reduction in bubble pressure (b) faceted cavities in the samples (c) a smaller increase in titanium lattice pa- rameters (d) a 16-fold reduction in average bubble size and a sixfold reduction in bubble area fraction (e) a more than twofold decrease in exfoliation (f) a tendency toward the formation of larger bubbles as a result of heat treatment. We believe that it is reasonable to assume that the inhibition of helium diffusion between tetrahedral interstitial lattice sites takes place because of the occupation of the intermediate octahedral sites by hydrogen atoms.
Evidence for the opposite effect, that is inhibition of the diffusion of hydrogen in the presence of helium, is found in the retention of hydrogen in the specimens at elevated temperatures. This retention allowed the exis- tence of titanium hydride after heat treatment at 680 °C. The present study sheds light on the intricate interplay between hydrogen and helium in titanium, providing insights into mechanisms that can potentially mitigate helium-induced damage in materials.
Keywords: Bubble formation; Helium implantation; Pre-implantation; Plasma-facing materials (PFMs); Nuclear technology; Irradiation damage; Helium diffusion; Titanium hydride; Blisters; Surface exfoliation; Repulsive interactions; EELS
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39044) publication
-
Journal of Nuclear Materials 594(2024), 155017
DOI: 10.1016/j.jnucmat.2024.155017
Cited 1 times in Scopus
Downloads
- Secondary publication expected
Permalink: https://www.hzdr.de/publications/Publ-39044
Experimental and theoretical study on the production of carbide-rich composite nano-coatings
Fogarassy, Z.; Kentsch, U.; Panjan, P.; Racz, A. S.
Abstract
Carbides are known for high hardness and corrosion resistance and therefore applicable as protective coatings. C/Si and C/W multilayers (the individual layer thicknesses were between 10 and 20 nm) have been irradiated at room temperature by argon and xenon ions. The energies varied between 40 and 120 keV while the fluences were in the range of 0.07 - 6 × 10¹⁶ ions/cm². The SRIM simulation was applied to have the proper ion energy. The irradiation induced intermixing and carbide (SiC and WC) formation at the interfaces already for the lowest irradiation fluence. The component in-depth distribution has been determined by AES depth profiling which showed that it varied greatly as a function of the irradiation conditions and layer structure. In both material pair the thickness of the produced carbide increased with square root of fluence but the mixing mechanism were different: local spike for C/W and ballistic for C/Si. The mixing efficiency was lower for the C/Si than for the C/ W.
Keywords: WC; SiC; Carbide; Irradiation; Multilayer; Mixing
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 36666) publication
-
Surfaces and Interfaces 38(2023), 102773
DOI: 10.1016/j.surfin.2023.102773
Cited 5 times in Scopus
Permalink: https://www.hzdr.de/publications/Publ-36666
Combined Au/Ag nanoparticle creation in ZnO nanopillars by ion implantation for optical response modulation and photocatalysis
Macková, A.; Jagerová, A.; Lalik, O.; Mikšová, R.; Poustka, D.; Mistrík, J.; Holý, V.; Schutter, J. D.; Kentsch, U.; Marvan, P.; Azarov, A.; Galeckas, A.
Abstract
ZnO nanopillars were implanted with Au-400 keV and Ag-252 keV ions with ion fluences from 1 × 10¹⁵ cm⁻² to 1 × 10¹⁶ cm⁻². We compared ZnO nanopillars solely implanted with Au-ions and dually-implanted with Au and Ag-ions. Rutherford Back-Scattering spectrometry (RBS) confirmed Ag and Au embedded in ZnO nanopillar layers in a reasonable agreement with theoretical calculations. A decreasing thickness of the ZnO nanopillar layer was evidenced with the increasing ion implantation fluences. Spectroscopic Ellipsometry (SE) showed a decrease of refractive index in the nanopillar parts with embedded Au, Ag-ions. XRD discovered vertical domain size decreasing with the proceeding radiation damage accumulated in ZnO nanopillars which effect was preferably ascribed to Au-ions. SE and diffuse reflectance spectroscopy (DRS) showed optical activity of the created nanoparticles at wavelength range 500 – 600 nm and 430 – 700 nm for the Au-implanted and Au, Ag-implanted ZnO nanopillars, respectively. Photoluminescence (PL) features linked to ZnO deep level emission appear substantially enhanced due to plasmonic interaction with metal nanoparticles created by Ag, Au-implantation. Photocatalytic activity seems to be more influenced by the nanoparticles presented in the layer rather than the surface morphology. Dual implantation with Ag, Au-ions enhanced optical activity to a larger extent without significant morphology deterioration as compared to the solely Au-ion implanted nanopillars.
Keywords: ZnO nanopillars; Au/Ag nanoparticles; ion implantation; SPR; doped ZnO nanostructures
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 35956) publication
-
Applied Surface Science 610(2023), 155556
Online First (2022) DOI: 10.1016/j.apsusc.2022.155556
Cited 16 times in Scopus
Permalink: https://www.hzdr.de/publications/Publ-35956
