Electron Probe Micro Analysis (EPMA)
The EPMA is an analytical technique used to non-destructively determine the chemical composition of small volumes of solid materials. The associated instrument, the electron probe micro analyzer, is informally referred to as an electron microprobe.
Technical Specifications
Application
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Sample Requirements
Limitations
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Selected Publications ►
- Atanasova, P.; Krause, J.; Moeckel, R.; Osbahr, I.; Gutzmer, J.;
"Trace element geochemistry of sphalerite in contrasting hydrothermal fluid systems of the Freiberg district, Germany: insights from LA-ICP-MS analysis, near-infrared light microthermometry of sphalerite-hosted fluid inclusions, and sulfur isotope geochemistry", Mineralium Deposita 54(2019)2, 237-262
DOI-Link: 10.1007/s00126-018-0850-0
- Burisch, M.; Hartmann, A.; Bach, W.; Krolop, P.; Gutzmer, J.;
"Genesis of hydrothermal silver-antimony-sulfide veins of the Braunsdorf sector as part of the classic Freiberg silver mining district, Germany", Mineralium Deposita 54(2019)2, 263-280
DOI-Link: 10.1007/s00126-018-0842-0
- Kern, M.; Möckel, R.; Krause, J.; Teichmann, J.; Gutzmer, J.;
"Calculating the deportment of a fine-grained and compositionally complex Sn skarn with a modified approach for automated mineralogy", Minerals Engineering 116(2018), 213-225
DOI-Link: 10.1016/j.mineng.2017.06.006
- Bachmann, K.; Osbahr, I.; Tolosana-Delgado, R.; Chetty, D.; Gutzmer, J.;
"Major and Trace Element Geochemistry of the European Kupferschiefer – An Evaluation of Analytical Techniques", Geostandards and Geoanalytical Research (2018)
DOI-Link: 10.3749/canmin.1700094
- Bauer, M. E.; Burisch, M.; Ostendorf, J.; Krause, J.; Frenzel, M.; Seifert, T.; Gutzmer, J.;
"Indium and selenium distribution in the Neves-Corvo deposit, Iberian Pyrite Belt, Portugal", Mineralogical Magazine 82(2018), S5-S41
DOI-Link: 10.1007/s00126-018-0850-0
How does it work? ►
EPMA works similarly to a scanning electron microscope, with the added capability of chemical analysis: The sample is bombarded with electron beams and emits a characteristic X-ray radiation which is detected by crystal spectrometers. The respective element concentrations can be determined by comparison measurements of a standard material of known composition and subsequent extensive correction calculations.