Contact

Dr. René Hübner

Head Structural Analysis
Electron Microscopy Laboratory
r.huebnerAthzdr.de
Phone: +49 351 260 3174

Analytical Transmission Electron Microscopy

Equipment

Topics of Research

The TEM is mainly used for the investigation of the effects of ion implantation and layer deposition on the micro- and nano-scale. Due to the primary interest on depth profiles, cross-sectional specimens prepared in our own TEM laboratory are mainly analyzed. Besides classical TEM specimen preparation (sawing, grinding, polishing, dimpling, and Ar ion milling), target preparation can be done using a focused ion beam device (FIB, Helios 5 CX). The TEM is open for performing all relevant tasks at HZDR as well as to partners in academics and industry. Currently, contributions to the following topics are delivered:

  • Verification of shaping effects of nano-particles by ion irradiation
  • Ion-beam induced surface modification
  • Analysis of semiconductor structures
  • Characterization of advanced absorber materials for photovoltaics
  • Analysis of modern materials for batterie technology
  • Incorporation and binding of uranium in microorganisms (cooperation with Institute of Resource Ecology)