Helium Ion Microscopy
Helium Ion Microscopy (HIM) is an advanced focus ion beam technology that allows imaging and nano fabrication of conductive as well as insulating materials with unprecendented resolution.
Basics
HIM utilizes a the apex of a tungsten tip to ionize noble gas atoms. Shaping the tip on the atomic level allows to use only the last three atoms of the apex for this purpose. This trimer and apertures in the ion optical column lead to a source size of only 0.25 nm which results in a beam spot with a diameter of only 0.5 nm. Currently the gas can either be He or Ne. While the former is mostly used for imaging the later allows high resolution nano fabrication.
Instrumentation
- 0.5 nm He beam 10-35 keV
- 2 nm Ne beam 5-25 keV
- GIS injection system for IBID (W(Co)6, HRD, XeF2)
- In-situ backscatter spectrometry and secondary ion mass spectrometry (50 nm lateral resolution)
- 4 Kleindiek MM3A micromanipulators
- Heating stage (<500°C)
| Orion NanoFab | HIM Trimer |
| Foto: Carl Zeiss | Foto: Gregor Hlawacek |
| Download | Download |
Applications
| high resolution imaging | nanofabrication |
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Current projects
GoFIB (05/2022-04/2025)
Gallium oxide is a novel ultra-wide band gap material, and the rationale is that its thin film fabrication technology is immature. In particular, the metastability conditions are difficult to control during sequential deposition of different polymorphs with existing techniques. However, the polymorphism may turn into a significant advantage if one can gain control over the polymorph multilayer and nanostructure design. Our objective is to develop a method for the controllable solid state polymorph conversion of gallium oxide assisted by ion irradiation, capitalizing on encouraging preliminary data. This fabrication method may pave the way for several potential applications (e.g. in power electronics, optoelectronics, thermoelectricity, batteries) and we will test the corresponding functionalities during the project. Thus, we envisage multiple positive impacts and potential benefits across a wide range of stakeholders.
FIT4NANO (04/2020-10/2024)
The aim of the Action is to create a coordinated effort in the field of ion beam based nanoengineering that will put European researchers and commercial businesses at the forefront of the quickly moving field of functional nanostructured materials. The Action will unite developers and practitioners of focused ion beam technology to enable them to build the most efficient tool sets and application techniques for the identification, fabrication and characterization of next generation functional nanomaterials. The Action will develop ion sources and instrumentation for the sub 10 nm fabrication and materials analysis. These objectives will be reached through Europe wide networking between researchers from theoretical and experimental groups traditionally not interacting closely. The challenge to overcome is the increasing fragmentation of the FIB landscape between operators of established technologies, developers providing new techniques and methods and designers of functional nanomaterials not aware of the possibilities provided by these emerging focused ion beam technology and methods.
npSCOPE (01/2017-12/2020)
Within the npSCOPE project, a new instrument that couples the extraordinarily high resolution obtained with the finely focussed ion beam provided by a Gas Field Ion Source with sensors for composition (by mass spectrometry) and 3D visualisation (by transmission ion microscopy) will be developed. The tool will allow for an extensive characterisation of individual nanoparticles and their exact location in a given environment (tissue, cells, etc.) leading to a better understanding of their potential risks for human health and/or the environment. Hard- and software based on correlative microscopy approaches along with optimized sample-handling methods will therefore be developed to obtain a complete physico-chemical characterization of nanoparticles.
picoFIB (05/2017-04/2020)
The PicoFIB Network brings together international researchers with an interest in material manipulation and characterisation using novel gas-ion patterning and microscopy. It provides a foundation for knowledge exchange, technical training and research development. Outputs find application across the fields of nano-devices, energy technology and bio-materials. It comprises a series of exchange visits, training events and international workshops.
IONS4SET (02/2016-07/2020)
This projected, which started in February 2016, is aimed at the fabrication of a CMOS compatible single electron transistor that works at room temperature. This bold goal will be achieved by a combination of nanofabrication tehcniques and ion beam techniques. The HIM plays a leading role in this context as we will demonstrate that using the nanosized beam of the HIM we can form a single silicon nano cluster inside a burried SiO2 layer. After the nano sized beam of the HIM has been used to locally mix Si into SiO2 the cluster formation will be completed by a thermal treatment.
Analytical Ion Microscopy (finished)
This project led to the development of the worlds first backscatter time of flight spectrometer for the helium ion microscope. The achieved lateral resolution of 50 nm sets new standards for imaging backscatter spectrometry. The design of the spectrometer is such that it is minimal invasive to the microscope and hence ensures that the key performance parameters of the instruments are not influenced in a negative way. In addition the setup can be used for secondary ion mass spectrometry with an even better lateral resolution.
Publications
Recent publications
All publications
2026
Field-driven vortex pinning and flux quantization effects in W–C complex superconducting arrays using 3D nanoprinting
A. Arroyo-Fructuoso, G. Hlawacek, V. M. Fomin, R. Córdoba
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 42384) publication
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Data publication: Field-driven vortex pinning and flux quantization effects in …
ROBIS: 42568 HZDR-primary research data are used by this (Id 42384) publication
Permalink: https://www.hzdr.de/publications/Publ-42384
Optical absorption and emission in nitrogen-implanted Ga2O3 controlled by dynamic defect annealing
A. Azarov, A. Galeckas, U. Bektas, G. Hlawacek, A. Kuznetsov
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 42307) publication
Downloads
Permalink: https://www.hzdr.de/publications/Publ-42307
Defect Analysis of the Beta- to Gamma-Ga2O3 phase transition
U. Bektas, M. O. Liedke, H. Liu, F. Ganss, M. Butterling, N. Klingner, R. Hübner, I. Makkonen, A. Wagner, G. Hlawacek
Involved research facilities
- Radiation Source ELBE DOI: 10.17815/jlsrf-2-58
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-2-58 is cited by this (Id 41946) publication
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 41946) publication
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Defect Analysis of the Beta- to Gamma-Ga2O3 phase transition
ROBIS: 41066 HZDR-primary research data are used by this (Id 41946) publication -
Defect Analysis of the Beta- to Gamma-Ga2O3 phase transition
RODARE: 3706 HZDR-primary research data are used by this (Id 41946) publication
Permalink: https://www.hzdr.de/publications/Publ-41946
2025
Confinement driven spin-texture evolution in directly written nanomagnets
M. S. Anwar, I. Zelenina, P. Sobieszczyk, G. Hlawacek, K. Tveitstøl, K. Potzger, J. Faßbender, O. Hellwig, J. Lindner, M. Krupiński, M. Nord, R. Bali
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 41714) publication
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Data publication: Confinement driven spin-texture evolution in directly …
ROBIS: 41716 HZDR-primary research data are used by this (Id 41714) publication
Permalink: https://www.hzdr.de/publications/Publ-41714
Characterizing Interlayer Excitons by Spectral Signature in Scattering Visible Near-Field Microscopy
O. Garrity, I. Niehues, A. Bergmann-Iwe, A. Wróblewska, L. Pirker, A. Bukhari, G. Hlawacek, T. Korn, O. Frank, P. Kusch
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
Related publications
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 41685) publication
Permalink: https://www.hzdr.de/publications/Publ-41685
High-Resolution Correlative Microscopy Approach for Nanobio Interface Studies of Nanoparticle-Induced Lung Epithelial Cell Damage
R. Podlipec, L. Pirker, A. Krišelj, G. Hlawacek, A. Gianoncelli, P. Pelicon
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39945) publication
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Data publication: Novel correlative microscopy approach for nano-bio interface …
ROBIS: 40160 HZDR-primary research data are used by this (Id 39945) publication
Permalink: https://www.hzdr.de/publications/Publ-39945
Programmable activation of quantum emitters in high-purity silicon with focused carbon ion beams
M. Hollenbach, N. Klingner, P. Mazarov, W. Pilz, A. Nadzeyka, F. Mayer, N. V. Abrosimov, L. Bischoff, G. Hlawacek, M. Helm, G. Astakhov
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39025) publication
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Data publication: Programmable activation of quantum emitters in high-purity …
ROBIS: 39026 HZDR-primary research data are used by this (Id 39025) publication
Permalink: https://www.hzdr.de/publications/Publ-39025
2024
Fabrication of palladium-enriched metallic structures by direct focused He+ and Ne+ beam nanowriting from organometallic thin films: a com- parison with Ga+ and e− beams
L. Herrer, A. Salvador-Porroche, G. Hlawacek, P. Cea, J. María De Teresa
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39806) publication
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Data publication: Current vs voltage raw data
ROBIS: 39808 HZDR-primary research data are used by this (Id 39806) publication -
Data publication: Fabrication of palladium-enriched metallic structures by …
ROBIS: 39807 HZDR-primary research data are used by this (Id 39806) publication
Permalink: https://www.hzdr.de/publications/Publ-39806
Focused electron beam induced deposition of magnetic tips for improved magnetic force microscopy
A. T. Escalante-Quiceno, V. V. Fernández, J. I. Martín, A. Hierro-Rodriguez, G. Hlawacek, M. Jaafar, A. Asenjo, C. Magén, J. M. de Teresa
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39804) publication
Downloads
Permalink: https://www.hzdr.de/publications/Publ-39804
Studies of the morphology of hematite synthesized from waste iron sulfate
K. Splinter, R. Möckel, G. Hlawacek, Z. Lendzion-Bielun
Permalink: https://www.hzdr.de/publications/Publ-39174
Tuning the Electronic Characteristics of Monolayer MoS2-Based Transistors by Ion Irradiation: The Role of the Substrate
Z. Fekri, P. Chava, G. Hlawacek, M. Ghorbani Asl, S. Kretschmer, W. Awan, V. Koladi Mootheri, N. Sycheva, A. George, A. Turchanin, K. Watanabe, T. Taniguchi, M. Helm, A. Krasheninnikov, A. Erbe
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 39152) publication
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Data publication: Tuning the Electronic Characteristics of Monolayer …
ROBIS: 39191 HZDR-primary research data are used by this (Id 39152) publication
Permalink: https://www.hzdr.de/publications/Publ-39152
Contribution of black carbon and desert dust to aerosol absorption in the atmosphere of the Eastern Arabian Peninsula
M. M. K. Mahfouz, G. Skok, J. Sciare, M. Pikridas, M. Rami Alfarra, S. Moosakutty, B. Alfoldy, M. Ivančič, M. Rigler, A. Gregorič, R. Podlipec, S. Lohmann, G. Hlawacek, R. Heller, E. Tutsak, G. Močnik
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 38810) publication
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Data publication: Contribution of black carbon and desert dust to aerosol …
ROBIS: 40158 HZDR-primary research data are used by this (Id 38810) publication
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Permalink: https://www.hzdr.de/publications/Publ-38810
Ultralong-term high-density data storage with atomic defects in SiC
M. Hollenbach, C. Kasper, D. Erb, L. Bischoff, G. Hlawacek, H. Kraus, W. Kada, T. Ohshima, M. Helm, S. Facsko, V. Dyakonov, G. Astakhov
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 38750) publication
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Data publication: Ultralong-term high-density data storage with atomic defects …
ROBIS: 38751 HZDR-primary research data are used by this (Id 38750) publication
Permalink: https://www.hzdr.de/publications/Publ-38750
Defects distribution and evolution in selected-area helium ion implanted 4H-SiC
Y. Song, Z. Xu, M. Rommel, G. Astakhov, G. Hlawacek, F. Fang
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 37512) publication
Downloads
- Final Draft PDF 2,1 MB Secondary publication
Permalink: https://www.hzdr.de/publications/Publ-37512
