Programming window / Retention

The programming window size is a key parameter for memories. It is derived from the shift of the CV- curve. It was shown, that this programming window is larger for samples containing bulk and interface clusters compared to samples containing bulk clusters only. However, the data retention was found to be worse.
   
 

Silicon nanocluster based structures show a better retention behavior than similiar Ge based ones. The correlation to microstructural properties is a main topic of current research activities.