Structural and chemical evolution of Au-silica core-shell nanoparticles during 20 keV helium ion irradiation: a comparison between experiment and simulation

M. Mousley, W. Moeller, P. Philipp, G. Hlawacek, T. Wirtz, S. Eswara

• Scientific Reports 10(2020), 12058

Photoluminescence and Raman Spectroscopy Study on Color Centers of Helium Ion-Implanted 4H–SiC

Y. Song, Z. Xu, R. Li, H. Wang, Y. Fan, M. Rommel, J. Liu, G. Astakhov, G. Hlawacek, B. Li, J. Xu, F. Fang

• Nanomanufacturing and Metrology 3(2020), 205-217

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• Zweitveröffentlichung erwartet ab 15.09.2021

Freestanding and Supported MoS2 Monolayers under Cluster Irradiation: Insights from Molecular Dynamics Simulation

S. Ghaderzadeh, V. Ladygin, M. Ghorbani Asl, G. Hlawacek, M. Schleberger, A. Krasheninnikov

• ACS Applied Materials and Interfaces 12(2020)33, 37454-37463

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• Zweitveröffentlichung erwartet ab 28.07.2021

Helium Ion Microscopy for Reduced Spin Orbit Torque Switching Currents

P. Dunne, C. Fowley, G. Hlawacek, J. Kurian, G. Atcheson, S. Colis, N. Teichert, B. Kundys, M. Venkatesan, J. Lindner, A. M. Deac, T. Hermans, J. Coey, B. Doudin

• Nano Letters (2020)

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• Zweitveröffentlichung erwartet ab 15.09.2021

General Colloidal Synthesis of Transition-Metal Disulfide Nanomaterials as Electrocatalysts for Hydrogen Evolution Reaction

C. Meerbach, B. Klemmed, D. Spittel, C. Bauer, Y. J. Park, R. Hübner, H. Y. Jeong, D. Erb, H. S. Shin, V. Lesnyak, A. Eychmüller

• ACS Applied Materials and Interfaces 12(2020)11, 13148-13155

Formation of Thin NiGe Films by Magnetron Sputtering and Flash Lamp Annealing

V. Begeza, E. Mehner, H. Stöcker, Y. Xie, A. García, R. Hübner, D. Erb, S. Zhou, L. Rebohle

• Nanomaterials 10(2020)4, 648

Conductive ITO interfaces for optoelectronic applications based on highly ordered inverse opal thin films

L. Galle, S. Ehrling, S. Lochmann, S. Kaskel, L. Bischoff, J. Grothe

• ChemNanoMat 6(2020)4, 560-566

Sputtering of nanostructured tungsten and comparison to modelling with TRI3DYN

R. Stadlmayr, P. S. Szabo, D. Mayer, C. Cupak, T. Dittmar, L. Bischoff, S. Möller, M. Rasinski, R. A. Wilhelm, W. Möller, F. Aumayr

• Journal of Nuclear Materials 532(2020), 152019-1-152019-9

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• Zweitveröffentlichung erwartet ab 07.02.2021

An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterization

S. H. Andany, G. Hlawacek, S. Hummel, C. Brillard, M. Kangül, G. E. Fantner

Verknüpfte Publikationen

• HIM and AFM Data set from first AFM in the HIM test (Id 30718) HZDR-primary research data are used by this (Id 30689) publication

• Beilstein Journal of Nanotechnology 11(2020), 1272-1279

Boron Liquid Metal Alloy Ion Sources for Special FIB Applications

L. Bischoff, N. Klingner, P. Mazarov, W. Pilz, F. Meyer

• Journal of Vacuum Science & Technology B 38(2020)4, 042801-1-042801-5

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• Final Draft PDF 435 kB Zweitveröffentlichung

Morphology modification of Si nanopillars under ion irradiation at elevated temperatures: plastic deformation and controlled thinning to 10 nm

X. Xu, K.-H. Heinig, W. Möller, H.-J. Engelmann, N. Klingner, A. Gharbi, R. Tiron, J. Borany, G. Hlawacek

• Semiconductor Science and Technology 35(2020)1, 015021

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• Volltext von iopscience.iop.org
• Volltext von arxiv.org

Channeling effects in gold nano-clusters under He ion irradiation: insights from molecular dynamics simulations

S. Ghaderzadeh, M. Ghorbani Asl, S. Kretschmer, G. Hlawacek, A. Krasheninnikov

• Nanotechnology 31(2020)3, 035302

Strain Anisotropy and Magnetic Domains in Embedded Nanomagnets

M. Nord, A. Semisalova, A. Kákay, G. Hlawacek, I. Maclaren, V. Liersch, O. Volkov, D. Makarov, G. W. Paterson, K. Potzger, J. Lindner, J. Faßbender, D. Mcgrouther, R. Bali

• Small 15(2019)52, 1904738

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns

M. Mousley, S. Eswara, O. de Castro, O. Bouton, N. Klingner, C. T. Koch, G. Hlawacek, T. Wirtz

• Beilstein Journal of Organic Chemistry 10(2019), 1648-1657

Lithium Ion Beams from Liquid Metal Alloy Ion Sources

W. Pilz, P. Mazarov, N. Klingner, S. Bauerdick, L. Bischoff

• Journal of Vacuum Science & Technology B 37(2019)2, 021802-1-021802-4

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• Final Draft PDF 497 kB Zweitveröffentlichung

Time-of-flight secondary ion mass spectrometry in the helium ion microscope

N. Klingner, R. Heller, G. Hlawacek, S. Facsko, J. von Borany

• Ultramicroscopy 198(2019), 10-17

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• Final Draft PDF 6,8 MB Zweitveröffentlichung